A perfect technology storm
The industry dilemma: Innovation has higher risk
The development of nanometer-scale technologies and new materials has raised testing challenges into the limelight. From technology reports and road maps to the analyst’s reports, testing’s impact on the semiconductor industry is enormous for the 300 mm era and beyond; reliability data is indispensable in the process of selecting new materials. Therefore, it is critical to have scalable and cost effective parametric and reliability testing for modern manufacturing.
The ASUR Family:
One hardware, one software, from instruments to systems
ASUR is a scalable solution in which data can be correlated from instruments to systems and to packaged testers. ASUR can be used in IDM, foundries, fabless and equipment companies, reducing development cycle time while helping control maturing processes. Useful at all phases of the IC life cycle-development, qualification, production, and quick identification of reliability problems, including the maturing processes.
- Precision Architecture and Scalable Test Control
- Industry’s only true scaleable platform solution architecture
- True per-pin to multi-group without relaxation in one software - Agilent WLR Technology DNA Inside
- Agilent Reliability DNA now in its Fifth Generation
- One software family, one hardware family; no doubts - Superior phenomena detection
- Greater sophistication and control in capturing new reliability phenomena
- Better decisions with advanced detection mechanisms for more accurate statistics - Industry’s only dedicated reliability analysis environment
- Powerfully integrated analysis and problem solving for immediate knowledge
- The original and only progressive analysis standard in semiconductor test for 10 years - Improve your timing for business decisions
- Confident marketing decisions and planning in real time
- Lower cost with higher speed, certainty and confidence
More Information
- C1280A ASUR Parallel Device Reliability (ASUR PDR)
ASUR PDR is a high-performance, long-term and accelerated reliability solution for multi-site, parallel testing using instruments-based solutions on the Windows platform. - C1281A ASUR Single Device Reliability (ASUR SDR)
ASUR SDR is a high-performance, low-cost, accelerated reliability and parametric solution for single-site testing using instruments-based solutions on the Windows platform. - C1282A ASUR Reliability Data Analyzer (ASUR RDA)
ASUR RDA is a high-performance, low-cost, accelerated reliability and parametric test data analysis solution. ASUR RDA speeds lifetime extraction for faster test cycle time and time-to-decisions. - ASUR Production Wafer-Level Reliability (ASUR PDQ-WLR®)
ASUR SDR is a single site solution for Wafer Level Reliability and Parametric Test for the 4070 and SPECS on the HPUX platform. - E5311A-A01 ASUR Reliability Test Structure Library (ASUR PDQ-FAB™)
ASUR PDQ-FAB™ is a Reliability Test Structure Library which can be dropped into your test structure CAD design saving time and learning curve required to create usable reliability test targets. - ASUR Reliability and Parametric Test Consulting (ASUR Expert)
Core Wafer System’s extensive knowledge base of over 100 man-years of semiconductor industry experience in nearly every aspect of the parametric and reliability test...
