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Agilent Technologies - Modular Source Monitor Unit Series
E5260A 8-Slot High Speed Measurement Mainframe

General Features

Measurement Capabilities

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The Agilent E5260A lowers your cost-of-test by providing a high-speed parametric test solution for semiconductor, RFIC, and optical component testing. Key features include a modular configuration with eight slots available for plug-in modules, high-speed DC measurement of current and voltage, enhanced measurement speed for fast throughput, expanded program memory, 16 digital I/O lines for sophisticated triggering requirements, and parallel test capability.

Fast measurement that lowers cost-of-test

The fast measurement speed and modular nature of the E5260A makes it an ideal choice for high-speed production test. For technologically advanced devices of today and tomorrow, the Agilent E5260A lowers your cost-of-test with a high-speed parametric test solution for semiconductor, RFIC, and optical component testing. Based on well-proven Agilent 4070 Series system technology, the E5260A provides superior measurement throughput that is several times faster than earlier products such as the Agilent 4142B. The instrument is modular, which enables customization now and provides for future expansion as requirements change. A number of innovative design elements help to improve the efficiency of complex testing, such as expanded program memory to accelerate the measurement process, and 16 digital I/O lines for sophisticated triggering requirements. Moreover, historically encountered power limitations on the instrument mainframe (such as often occur with the 4142B) have been eliminated. The E5260A ranges in price from US $20,000 to $55,000, depending on module configuration and options.

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Features and Benefits

Feature Benefit
Eight module slots Flexibility now and expandability in the future
SMUs that measure several times faster than 4142B SMUs Faster test times and improved throughput, resulting in a lower cost-of-test
Code compatible with the 4142B Replace current 4142Bs with the E5260A and enjoy a large throughput improvement with only minimal test code modification
16 digital I/O lines for instrument triggering in addition to BNC trigger-in & trigger-out connectors Sophisticated triggering schemes involving multiple instruments can easily be created
All trigger signals are processed via hardware rather than firmware Fastest possible trigger response from the instrument
Front panel control Can conveniently perform and report spot measurements via a simple front-panel interface, without programming.  View other items of interest, such as error messages, valuable when debugging the instrument performance under automated control.
When 4 HPSMUs are installed then each HPSMU can output 1 A No power restrictions; no need to think about mainframe power restrictions when developing applications
4.0 Amp Ground unit (GNDU) Sink the current output of 4 HPSMUs without worrying about resistive ground rise issues

Components

Key Specifications

Mainframe Characteristics
  E5260A 8-Slot High Speed Measurement Mainframe
Available Slots 8
Ground Unit (GNDU) Sink Capability 4.0 A
Instrument Control GPIB
External Trigger Inputs/Outputs 1 BNC Trigger In; 1 BNC Trigger Out; 8 Programmable Trigger In/Out

Module Selection Guide
  E5290A High Speed HPSMU E5291A High Speed MPSMU
Required Slots 2 1
Maximum force voltage ± 200 V ± 100 V
Maximum force current ± 1 A ± 200 mA
Voltage measurement resolution 100 µV 100 µV
Current measurement resolution 5 pA 5 pA

 

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