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ProTEQ Solutions provides the greater New England area with Agilent's Semiconductor Test Equipment.
Integrated circuit devices continue to shrink in size, increase in density, and improve in performance every year. Manufacturing and testing these devices while simultaneously maintaining and improving yield has become increasingly difficult. Nevertheless, Agilent Technologies' parametric test solutions continue to meet these challenges and to provide users with consistently accurate and highly automated test solutions for better process monitoring. Their award winning parametric test systems are a de facto industry standard, with over 2,900 systems installed worldwide. With a history of over 60 years of innovation and leadership in the Test and Measurement industry, Agilent knows what it takes to meet the stringent demands of parametric test customers.
- 41000 Series
The Agilent 41000 Series is a highly accurate CV-IV parametric measurement solution for the characterization of wafers in low-volume R&D, laboratory and process development environments.
- Modular Source Monitor Unit Series
A flexible family of products, with solutions for both precise parametric measurement of semiconductor devices and high speed testing of components (E5260A, E5262A, E5263A and E5270B).
- Low Leakage Switch Mainframe Family
Low-leakage switch mainframe solutions, positioned between the semiconductor parameter analyzer and the wafer, reduce cost of test through characterization test automation (B2200A, B2201A and E5250A).
- Reliability Test
The ASUR (Advanced Scalable Unified Reliability) product family provides a range of semiconductor reliability test structures, measurement and analysis (C1280A, C1281A and C1282A).
- Parametric Test Software
Intuitive software solutions designed to help you measure, analyze, report, and manage parametric test data.
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