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FEB. 2009 - ProTEQ signed as Technical Distributor for TEKTRONIX

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FEB. 2009 - ProTEQ signed as manufacturer's rep for AGILENT TECHNOLOGIES representing their Parametric Testing line of products.

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shock Save the date! We will be participating in the TEST FOR SUCCESS SHOW on April 9th at the Radisson Hotel in Nashua, NH from 9 - 3 PM.
bullet Congratulation to Joe Gentile from Analogic Devices- Winner of the AC/DC Car Power Converter drawing!

As of JANUARY 1, 2009 - Ametek announce price increase. Some products more considerable than others. Call to check on pricing.



Top Test and Measurement Equipment Manufacturers' Representative
for all of Greater New England.
Test & Measurement News - January 2009
Jump to New Products & Services


LeCroy Dealing with De-emphasis in Jitter Testing

This paper addresses the use of the linear:

Recently transmit de-emphasis has become a popular element in equalized serial data transmission systems. Most commonly, this is in the form (or an equivalent form) of a digital filter...READ MORE

Voltech Cycle-by-cycle mode


The analyzer determines frequency from either the voltage or the current signal and then measures Vrms, Arms, Watts, Power Factor and so on for each cycle.

For a fixed frequency signal, this will provide the rms data (as above) for each cycle. At 50Hz, for example, the measurements are provided for each 20ms period.

Cycle-by-cycle measurements are especially useful when the frequency of the signal is changing. A common example is ac motor start-up when perhaps the first 'cycle' is several hundred milliseconds long and then the cycle duration shortens as the rotational speed increases. The PM3000A will provide rms data for each cycle as the motor speeds up.

TIP: Set the frequency source to be 'current' rather than 'voltage' since the current waveform is generally less noisy, making it easier for the analyzer to direct the correct frequency.

In datalogging mode, the measurement recorded is the value at that particular time. For example, if the datalog period is set at 10s, then the analyzer records the measurementvalue at 10s, 20s, 30s and so on.

fluke Silver CarePlan

The Fluke Silver CarePlan is a comprehensive instrument warranty support plan that puts you in charge of your operating costs and protects your investment in your new Fluke instrument. The plan extends repair coverage for two or four additional years beyond factory warranty and included a standard or accredited calibraiton with any necessary repair.

Click Here for a Product Sheet

ametek, elgar, sorensen, california instruments
Compact i/iX Series

The Compact iX Series represents a new generation of AC/DC power sources that address the increasing demands on test equipment to perform additional functions at a lower cost. By combining a flexible AC/DC power source with a high performance power analyzer, the Compact iX Series is capable of handling complex applications that have traditionally required multiple systems.

The sleek integrated approach of the Compact iX Series avoids cable clutter that is commonly found in test systems. All connections are made internally and the need for digital multimeters, power harmonics analyzers, and current shunts or clamps is eliminated.

Since many components in the Compact iX Series are shared between the AC/DC source and the power analyzer, the total cost of the integrated system is less than the typical cost of a multiple unit system.

For less demanding applications, the Compact i Series provides similar output and transient capabilities as the Compact iX Series, as well as basic power measurements.

Click Here for a Product Sheet



4540 RF Peak Power Meter

The Boonton model 4540 Series is the instrument of choice for capturing, displaying and analyzing RF power in both the time and statistical domains. Applications include pulsed RF signals such as radar, TDMA and GSM, pseudorandom or noise-like signals such as CDMA, WLAN and WiMAX.

Click Here for a Product Sheet

Noisecom Analog Noise Generators - J7000A
The J7000A Series instruments high crest factor output is used as a random jitter source for serial data bus applications, including PCI Express Gen I & II, Serial ATA, and Fiber Channel. The noise source is designed for the PCI-SIG total jitter (Tj) model serial data application, but can be used for any random jitter noise application. The random nature of this output is designed to model real world electrical noise commonly found in digital electrical circuits. The summing input can control signal-to-noise (SNR) or carrier-to-noise (CNR) for bit-error-ratio (BER) testing similar to other Noisecom instruments. The signal path has a nominal insertion gain of 0 dB, with very low amplitude and phase ripple. Standard units can be modified for specific customer requirements. Please consult the factory for pricing and availability of these requests.

  • Serial Data sources and specialized filters **
  • Provides > 18 dB crest factor
  • 127 dB attenuation in 1 dB, or optional 0.1 dB steps*
  • Summing input for CNR, or Eb/No measurements
  • Standard Ethernet, or optional GPIB remote control
  • Optional rear panel connectors

* Units above 2 GHz have 79.9 dB attenuation
** Contact Noisecom for assistance with specific serial data specifications

Click Here for Product Sheet

LeCroy LeCroy's NEW WaveAce Series now shipping!

A good oscilloscope should simplify how you work and shorten the time it takes to find and debug problems. The WaveAce™ combines long memory, a color display, extensive measurement capabilities, advanced triggering and excellent connectivity to improve troubleshooting and shorten debug time. With bandwidths from 60 MHz to 300 MHz, sample rates up to 2 GS/s and waveform memory up to 9 kpts/Ch (18 kpts interleaved) the WaveAce exceeds all expectations of a small affordable oscilloscope.


  • 60 MHz to 300 MHz Bandwidths
  • Memory up to 9 kpts / channel (18 kpts interleaved)
  • 5.7" Color Display on All Models
  • USB connectivity for PCs, Printers and Memory Sticks

Click Here for Product Sheet

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